IEEE N42.31-2003 pdf free

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IEEE N42.31-2003 pdf free.American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation.
Abstract: Standard measurement and test procedures are established for wide-bandgap semiconductor detectors such as cadmium telluride (CdTe), cadmium-zinc-telluride (CdZnTe), and mercuric iodide (Hgl2) that can be used at room temperature for the detection and quantitative characterization of gamma-rays, X-rays, and charged particles. Standard terminology and descriptions of the principal features of the detectors are included. Included in this standard is an annex on interfering electromagnetic noise, which is a factor in such measurements.
Keywords: cadmium telluride, cadmium zinc telluride, CdTe, charged particle, CZT, electron-hole pair, gamma rays, Hgl, ionizing radiation, ion pair, MCA, mercuric iodide, multichannel analyzer, semiconductor detector, X-ray.
IEEE N42.31 applies to wide-bandgap semiconductor radiation detectors, such as cadmium telluride (CdTe), cadmiuni-zinc-telluride (CdZnTe, referred to herein as CZTL and mercuric iodide (HgI2,) used in the detection and measurement of ionizing radiation at room temperature; gamma rays, X-rays. and charged particles are covered. The measurement procedures described herein apply primarily to detector elements having planar, hemispherical, or other geometries in which charge carriers of both polarities contribute to the output signal. When the devices are an integral part of a system, it may not be possible for a user to make tests on the detector alone. In this instance, tests on the detector element must be established by mutual agreement between the manufacturer and the user.
The purpose of IEEE N42.31 is to establish terminology and test procedures that have the same meaning to both nianufacturers and users. Not all tests described in this standard arc mandatory, hut those used to specify performance shall be made in accordance with the procedures described herein. (Use of the word “shall” indicates a mandatory requirement, “must” a physical one, and “should” means ‘recommendcd.”)
3. Definitions, symbols, and abbreviations
3.1 Definitions
Specialized terms used in this standard plus some others that are relevant appear in this subclause. Most of the technical terms within the definitions are themselves defined here but, with a few exceptions, are not cross-referenced. Terms used infrequently in the document are defined where they appear; they may or may not be defined in this subclause.
3.1.1 active region: A region of a detector in which charge created by ionizing radiation contributes significantly to the output signal.
3.1.2 amplifier: An electronic instrument for increasing the amplitude of a signal.
3.1.3 amplifier shaping time: A nonspecific indication of the shaped-pulse width issuing from a pulse amplifier.

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